Hogan to Feature Two Speakers at 2017 ATP Conference

Posted by Hogan Assessments on Wed, Mar 01, 2017

Hogan representatives Dave Winsborough, VP of Innovation and head of Hogan X, and Blaine Gaddis, Sr. Manager of Product Research, will both present at this year’s ATP Innovations in Testing Conference in Scottsdale, AZ next week. The conference, which brings assessment industry professionals together, provides a venue for attendees to learn from and collaborate.

Winsborough will facilitate a Featured Speaker Session titled “Disruption of Traditional Assessment Systems: Are We the Walking Dead?” The session will focus on how digitization has created a fundamentally different testing landscape, and how these changes have enabled significant forces that disrupt traditional assessment. Given the choice between being disruptors or being disrupted, this session also seeks to discuss which kinds of response should be taken. The session will occur at 4:30 pm on Monday, March 6.

Gaddis will participate on a panel presentation on “Psychometric Test Security Approaches to Mitigating Cheating and Faking.” In this session assessment experts within I/O Psychology and Education fields will discuss the impact of faking, psychometric approaches to detecting faking and cheating, the use of response distortion measures and analytics, and the use of both technology and “psychometric forensics” to detect cheating.

Also participating on the panel are John Jones, Kelly Dages, and Andre Allen of General Dynamics Information Technology and Joe Orban of Questar Assessment, Inc. The session will take place at 2:30 pm on Monday, March 6.

If you’re planning to attend the conference, stop by and say hello to your friends at Hogan. If you’re unable to attend, follow our updates on Facebook and Twitter.

Topics: assessment, Hogan, faking, hogan X

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